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Young-Guk Son 5 Articles
624 The Effect of the Heat Treatment of the ZrO2 Buffer Layer and SBT Thin Film on Interfacial Conditions and Ferroelectric Properties of the SrBi2Ta2O9/ZrO2/Si Structure
Young-Hun Oh, Chul-Ho Park, Young-Guk Son
J. Korean Ceram. Soc. 2005;42(9):624
DOI: https://doi.org/10.4191/kcers.2005.42.9.624
      
104 Microstructure and Electrical Properties of the Pt/Pb1.1Zr0.53Ti0.47O3/PbO/Si (MFIS) Using the PbO Buffer Layer
Chul-Ho Park, Kyoung-Hwan Song, Young-Guk Son
J. Korean Ceram. Soc. 2005;42(2):104
DOI: https://doi.org/10.4191/kcers.2005.42.2.104
      
742 Microstructure and Ferroelectric Properties of PZT Thin Films Deposited on various Interlayers by R.F. Magnetron Sputtering
Chul-Ho Park, Duck-Young Choi, Young-Guk Son
J. Korean Ceram. Soc. 2002;39(8):742
DOI: https://doi.org/10.4191/kcers.2002.39.8.742
         Cited By 2
377 Preparation of ZrO2 and SBT Thin Films for MFIS Structure and Electrical Properties
Min-Cheol Kim, Woo-Suk Jung, Young-Guk Son
J. Korean Ceram. Soc. 2002;39(4):377
DOI: https://doi.org/10.4191/kcers.2002.39.4.377
         Cited By 2
394 Fabrication and Characterization of Sn1-xSixO2 Anode for Lithium Secondary Battery by R.F. Magnetron Sputtering Method
Sang-Heon Lee, Keun-Tae Park, Young-Guk Son
J. Korean Ceram. Soc. 2002;39(4):394
DOI: https://doi.org/10.4191/kcers.2002.39.4.394
         Cited By 1
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